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dc.contributor.authorLiu, Xiaoming
dc.contributor.authorGan, Lu
dc.contributor.authorYang, Bin
dc.date.accessioned2021-08-16T13:07:46Z
dc.date.available2021-08-16T13:07:46Z
dc.date.issued2021-05-07
dc.identifierhttps://chesterrep.openrepository.com/bitstream/handle/10034/625600/Measurement-Revision2-Accept.pdf?sequence=3
dc.identifier.citationLiu, X., Gan, L., & Yang, B. (2021). Millimeter-wave free-space dielectric characterization. Measurement, 179, 109472. https://doi.org/10.1016/j.measurement.2021.109472en_US
dc.identifier.issn0263-2241
dc.identifier.doi10.1016/j.measurement.2021.109472
dc.identifier.urihttp://hdl.handle.net/10034/625600
dc.description.abstractMillimeter wave technologies have widespread applications, for which dielectric permittivity is a fundamental parameter. The non-resonant free-space measurement techniques for dielectric permittivity using vector network analysis in the millimeter wave range are reviewed. An introductory look at the applications, significance, and properties of dielectric permittivity in the millimeter wave range is addressed first. The principal aspects of free-space millimeter wave measurement methods are then discussed, by assessing a variety of systems, theoretical models, extraction algorithms and calibration methods. In addition to conventional solid dielectric materials, the measurement of artificial metamaterials, liquid, and gaseous-phased samples are separately investigated. The pros of free-space material extraction methods are then compared with resonance and transmission line methods, and their future perspective is presented in the concluding part.en_US
dc.publisherElsevieren_US
dc.relation.urlhttps://www.sciencedirect.com/science/article/abs/pii/S0263224121004577en_US
dc.rights.urihttps://creativecommons.org/licenses/by-nc-nd/4.0/en_US
dc.subjectmillimeter waveen_US
dc.subjectdielectricen_US
dc.subjectpermittivityen_US
dc.subjectfree-spaceen_US
dc.subjectquasi-opticalen_US
dc.subjectcalibrationen_US
dc.titleMillimeter-Wave Free-Space Dielectric Characterizationen_US
dc.typeArticleen_US
dc.contributor.departmentAnhui Normal University; Wuhu CEPREI Information Industry Technology Research Institute; University of Chesteren_US
dc.identifier.journalMeasurementen_US
or.grant.openaccessYesen_US
rioxxterms.funderUnfundeden_US
rioxxterms.identifier.projectUnfundeden_US
rioxxterms.versionAMen_US
rioxxterms.versionofrecord10.1016/j.measurement.2021.109472en_US
rioxxterms.licenseref.startdate2023-05-07
dcterms.dateAccepted2021-04-20
rioxxterms.publicationdate2021-05-07
dc.date.deposited2021-08-16en_US
dc.indentifier.issn0263-2241en_US


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